AFM is most commonly referred to as atomic force microscopy. This process of microscopy refers to the process of observing nanomaterials in high quality from small samples. Some scientists use them to observe microchips, organic materials, and, in some cases, biology and material science.  What makes the AFM special is the amount of image quality that can be achieved due to using a process of a cantilever, which includes a sharp, tiny tip (probe) that scans the surface of the sample without touching the sample, which is how it gives you this clear image. This cantiliver can sometimes even be an atom apart from the sample. The key is a laser which comes off the AFM machine due to its reflection off the sample, the receiver from the machine can receive a positive sensitive detector (PSD), which is crucial to correct the image and finish the topography map of the image.

SEM is also most commonly referred to as a scanning electron microscope. This process of microscopy refers to the process of observing a large quantity of samples in a decent quality image. Most of these are used by scientist to observe nanomaterials such as microchips, particles, powder, or to observe materials in their natural state.